氧化硅的标准XRD特征峰有哪些?
氧化硅的标准XRD特征峰有哪些?
这里是sio的衍射卡片库
PDF#30-1127: QM=Doubtful(?); d=(Unknown); I=(Unknown)
Silicon Oxide
Si O
Radiation=CuKa1Lambda=1.5406Filter=
Calibration=d-Cutoff=I/Ic(RIR)=
Ref= Kurdyumov et al.
Inorg. Mater. (Engl. Transl.), 2 1539 (1966)
(Unknown) - Powder DiffractionZ=mp=
Cell=Pearson=
Density(c)=Density(m)=2.155Mwt=44.08Vol=0.00
Ref= Ibid.
Strong Line: 3.18/X 1.93/X 1.64/8 1.25/5 1.11/5 1.36/2 1.05/2 0.96/2 0.92/2 0.86/2
NOTE:Prepared by reacting polycrystalline silicon with silicon dioxide.
O assigned because unindexed.
d(A) I(f) I(v)hkln^22-Theta Theta1/(2d) 2pi/d
3.180100.0 61.0 28.03614.0180.15721.9758
2.700 10.07.0 33.15216.5760.18522.3271
2.520 10.08.0 35.59717.7980.19842.4933
1.930100.0100.0 47.04523.5220.25913.2555
1.640 80.0 94.0 56.02728.0140.30493.8312
1.540 10.0 13.0 60.02430.0120.32474.0800
1.360 20.0 28.0 68.99734.4980.36764.6200
1.320 10.0 15.0 71.40135.7000.37884.7600
1.250 50.0 77.0 76.08238.0410.40005.0265
1.110 50.0 87.0 87.88743.9430.45055.6605
1.050 20.0 37.0 94.37847.1890.47625.9840
0.960 20.0 40.0106.71553.3570.52086.5450
0.920 20.0 42.0113.70456.8520.54356.8295
0.8905.0 11.0119.87659.9380.56187.0598
0.860 20.0 45.0127.19063.5950.58147.3060
0.8405.0 11.0132.98366.4910.59527.4800
0.830 20.0 47.0136.26568.1330.60247.5701
0.790 20.0 49.0154.34277.1710.63297.9534