氧化硅的标准XRD特征峰有哪些?

问题描述:

氧化硅的标准XRD特征峰有哪些?

这里是sio的衍射卡片库
PDF#30-1127: QM=Doubtful(?); d=(Unknown); I=(Unknown)
Silicon Oxide
Si O
Radiation=CuKa1Lambda=1.5406Filter=
Calibration=d-Cutoff=I/Ic(RIR)=
Ref= Kurdyumov et al.
Inorg. Mater. (Engl. Transl.), 2 1539 (1966)
(Unknown) - Powder DiffractionZ=mp=
Cell=Pearson=
Density(c)=Density(m)=2.155Mwt=44.08Vol=0.00
Ref= Ibid.
Strong Line: 3.18/X 1.93/X 1.64/8 1.25/5 1.11/5 1.36/2 1.05/2 0.96/2 0.92/2 0.86/2
NOTE: Prepared by reacting polycrystalline silicon with silicon dioxide.
O assigned because unindexed.
d(A) I(f) I(v) h k l n^2 2-Theta Theta 1/(2d) 2pi/d
3.180 100.0 61.0 28.036 14.018 0.1572 1.9758
2.700 10.0 7.0 33.152 16.576 0.1852 2.3271
2.520 10.0 8.0 35.597 17.798 0.1984 2.4933
1.930 100.0 100.0 47.045 23.522 0.2591 3.2555
1.640 80.0 94.0 56.027 28.014 0.3049 3.8312
1.540 10.0 13.0 60.024 30.012 0.3247 4.0800
1.360 20.0 28.0 68.997 34.498 0.3676 4.6200
1.320 10.0 15.0 71.401 35.700 0.3788 4.7600
1.250 50.0 77.0 76.082 38.041 0.4000 5.0265
1.110 50.0 87.0 87.887 43.943 0.4505 5.6605
1.050 20.0 37.0 94.378 47.189 0.4762 5.9840
0.960 20.0 40.0 106.715 53.357 0.5208 6.5450
0.920 20.0 42.0 113.704 56.852 0.5435 6.8295
0.890 5.0 11.0 119.876 59.938 0.5618 7.0598
0.860 20.0 45.0 127.190 63.595 0.5814 7.3060
0.840 5.0 11.0 132.983 66.491 0.5952 7.4800
0.830 20.0 47.0 136.265 68.133 0.6024 7.5701
0.790 20.0 49.0 154.342 77.171 0.6329 7.9534